Noncontact atomic force microscopy III

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2016, 7, 946–947, doi:10.3762/bjnano.7.86

• Interface Structures and Phenomena (CRISP), Yale University, P.O. Box 208284, New Haven, CT 06520-8284, USA 10.3762/bjnano.7.86 Keywords: atomic force microscopy, scanning force microscopy; Intense interest in nanoscale science and technology has been the main driving force behind a large number of

Noncontact atomic force microscopy II

• Mehmet Z. Baykara and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2014, 5, 289–290, doi:10.3762/bjnano.5.31

• Interface Structures and Phenomena (CRISP), Yale University, P.O. Box 208284, New Haven, CT 06520-8284, USA 10.3762/bjnano.5.31 Keywords: atomic force microscopy, scanning force microscopy; In order to visualize the atomic structure of materials in real space, a microscope with sub-nanometer resolution is